This application note describes methods for measuring the dielectric properties of materials using a network analyzer and converting s-parameters to dielectric properties. It outlines four conversion methods: Nicholson-Ross-Weir (NRW), NIST iterative, new non-iterative, and short circuit line (SCL). Each method has specific advantages and limitations. The NRW method is fast and non-iterative but has divergence issues at certain frequencies. The NIST iterative method provides smooth results and is suitable for low-loss materials. The new non-iterative method is also fast and non-iterative, with no divergence. The SCL method is suitable for permittivity measurement but requires an initial guess. The application note also discusses various measurement methods, including transmission/reflection line, open-ended coaxial probe, free space, and resonant methods. Each method involves specific procedures and considerations for accurate measurement. The note emphasizes the importance of selecting the appropriate method based on the material and desired accuracy. It also provides examples and calculations for each method, highlighting their effectiveness and limitations.This application note describes methods for measuring the dielectric properties of materials using a network analyzer and converting s-parameters to dielectric properties. It outlines four conversion methods: Nicholson-Ross-Weir (NRW), NIST iterative, new non-iterative, and short circuit line (SCL). Each method has specific advantages and limitations. The NRW method is fast and non-iterative but has divergence issues at certain frequencies. The NIST iterative method provides smooth results and is suitable for low-loss materials. The new non-iterative method is also fast and non-iterative, with no divergence. The SCL method is suitable for permittivity measurement but requires an initial guess. The application note also discusses various measurement methods, including transmission/reflection line, open-ended coaxial probe, free space, and resonant methods. Each method involves specific procedures and considerations for accurate measurement. The note emphasizes the importance of selecting the appropriate method based on the material and desired accuracy. It also provides examples and calculations for each method, highlighting their effectiveness and limitations.