This application note describes methods for measuring the dielectric properties of materials using a network analyzer, focusing on converting s-parameters to dielectric properties. It discusses four conversion methods: Nicholson-Ross-Weir (NRW), NIST iterative, new non-iterative, and short circuit line (SCL). Each method is applicable to different materials and has its own advantages and limitations. The note also covers the measurement procedures for each method, including setup, calibration, and data extraction. Additionally, it provides examples and calculations for each method, emphasizing the importance of choosing the appropriate method based on the material being measured. The note concludes with a summary of the key points and a guide for selecting the right measurement and conversion methods for different materials.This application note describes methods for measuring the dielectric properties of materials using a network analyzer, focusing on converting s-parameters to dielectric properties. It discusses four conversion methods: Nicholson-Ross-Weir (NRW), NIST iterative, new non-iterative, and short circuit line (SCL). Each method is applicable to different materials and has its own advantages and limitations. The note also covers the measurement procedures for each method, including setup, calibration, and data extraction. Additionally, it provides examples and calculations for each method, emphasizing the importance of choosing the appropriate method based on the material being measured. The note concludes with a summary of the key points and a guide for selecting the right measurement and conversion methods for different materials.