Atomic force microscopy (AFM) has advanced significantly, enabling atomic-scale imaging of both conductors and insulators in ultra-high vacuum. The most widely used technique for achieving atomic resolution in vacuum is frequency modulation AFM (FM-AFM). This technique, along with other dynamic AFM methods, is detailed in the review. Recent developments have greatly improved the spatial resolution and ease of use of AFM, opening new experimental possibilities, including the measurement of forces between individual atoms. AFM shares similarities with scanning tunneling microscopy (STM), but differs in that it uses a force sensor (cantilever) instead of a tunneling tip. The cantilever detects forces between the tip and sample, and its deflection is measured to determine the imaging signal. The force sensor is crucial for AFM, as it allows imaging of non-conductive materials, unlike STM, which requires electrical conductivity. AFM faces several challenges compared to STM, including stability issues, non-monotonic imaging signals, contributions from long-range forces, and noise in the imaging signal. Despite these challenges, AFM has achieved atomic resolution, particularly with dynamic AFM modes such as frequency modulation AFM. The development of AFM has been marked by significant progress in understanding and improving the performance of cantilevers, which are essential for detecting tip-sample forces. The review highlights the evolution of AFM from its invention to its current capabilities, emphasizing the role of FM-AFM in achieving atomic resolution. It discusses the physical observables in FM-AFM, including frequency shifts and damping forces, and the challenges in measuring these signals. The review also covers the applications of AFM, including imaging and spectroscopy, and recent developments such as dissipation measurements and dynamic lateral force microscopy. The review concludes with a summary of the key findings and future directions for AFM research, emphasizing its importance in surface science and the ongoing efforts to improve its performance and applications.Atomic force microscopy (AFM) has advanced significantly, enabling atomic-scale imaging of both conductors and insulators in ultra-high vacuum. The most widely used technique for achieving atomic resolution in vacuum is frequency modulation AFM (FM-AFM). This technique, along with other dynamic AFM methods, is detailed in the review. Recent developments have greatly improved the spatial resolution and ease of use of AFM, opening new experimental possibilities, including the measurement of forces between individual atoms. AFM shares similarities with scanning tunneling microscopy (STM), but differs in that it uses a force sensor (cantilever) instead of a tunneling tip. The cantilever detects forces between the tip and sample, and its deflection is measured to determine the imaging signal. The force sensor is crucial for AFM, as it allows imaging of non-conductive materials, unlike STM, which requires electrical conductivity. AFM faces several challenges compared to STM, including stability issues, non-monotonic imaging signals, contributions from long-range forces, and noise in the imaging signal. Despite these challenges, AFM has achieved atomic resolution, particularly with dynamic AFM modes such as frequency modulation AFM. The development of AFM has been marked by significant progress in understanding and improving the performance of cantilevers, which are essential for detecting tip-sample forces. The review highlights the evolution of AFM from its invention to its current capabilities, emphasizing the role of FM-AFM in achieving atomic resolution. It discusses the physical observables in FM-AFM, including frequency shifts and damping forces, and the challenges in measuring these signals. The review also covers the applications of AFM, including imaging and spectroscopy, and recent developments such as dissipation measurements and dynamic lateral force microscopy. The review concludes with a summary of the key findings and future directions for AFM research, emphasizing its importance in surface science and the ongoing efforts to improve its performance and applications.