The Atomic Force Microscope (AFM) is renowned for its wide range of spatial resolution, capable of magnifying in the third dimension (Z). However, scanning areas larger than 100 μm are generally impractical. AFM shares similarities with optical microscopes in terms of spatial range but offers unique capabilities such as non-contact and contact modes, making it a versatile tool in materials science and nanotechnology. The first atomic step was scanned using a tunneling microscope, which was developed in 1983. This technique required the sample to be conducting and operated in a vacuum, limiting its applications. AFM, introduced in 1986, aims to achieve similar spatial resolution without the need for low temperatures, vacuums, or conducting samples. The forces between the tip and the sample include attractive forces (van der Waals, electrostatic, and capillary) and repulsive forces (Pauli exclusion/ionic repulsion). The total potential energy is described by the Lennard-Jones potential, which is crucial for understanding the forces involved in AFM. AFM tips are designed to be mechanically pliant and operate in an elastic regime. They are typically made of silicon and can be customized for specific applications. The force transducer in AFM measures the interaction between the tip and the sample, and a feedback loop ensures that the force remains constant. AFM operates in both non-contact and contact modes. In non-contact mode, the cantilever oscillates near the surface, and changes in oscillation amplitude and phase are measured. In contact mode, the tip comes into contact with the sample, and the force-distance curve is used to determine the sample's topography. AFM also supports dynamic modes, where an additional piezo patch is placed on the cantilever to collect oscillation data. This mode is useful for studying the dynamics of sample interactions. AFM is not limited to imaging; it can also be used for nanolithography, where a probe can modify the properties of materials at the nanoscale. Additionally, AFM can be used in near-field microscopy to overcome the diffraction limit, providing high-resolution optical imaging. Overall, AFM is a powerful tool with a wide range of applications in materials science, nanotechnology, and microelectronics.The Atomic Force Microscope (AFM) is renowned for its wide range of spatial resolution, capable of magnifying in the third dimension (Z). However, scanning areas larger than 100 μm are generally impractical. AFM shares similarities with optical microscopes in terms of spatial range but offers unique capabilities such as non-contact and contact modes, making it a versatile tool in materials science and nanotechnology. The first atomic step was scanned using a tunneling microscope, which was developed in 1983. This technique required the sample to be conducting and operated in a vacuum, limiting its applications. AFM, introduced in 1986, aims to achieve similar spatial resolution without the need for low temperatures, vacuums, or conducting samples. The forces between the tip and the sample include attractive forces (van der Waals, electrostatic, and capillary) and repulsive forces (Pauli exclusion/ionic repulsion). The total potential energy is described by the Lennard-Jones potential, which is crucial for understanding the forces involved in AFM. AFM tips are designed to be mechanically pliant and operate in an elastic regime. They are typically made of silicon and can be customized for specific applications. The force transducer in AFM measures the interaction between the tip and the sample, and a feedback loop ensures that the force remains constant. AFM operates in both non-contact and contact modes. In non-contact mode, the cantilever oscillates near the surface, and changes in oscillation amplitude and phase are measured. In contact mode, the tip comes into contact with the sample, and the force-distance curve is used to determine the sample's topography. AFM also supports dynamic modes, where an additional piezo patch is placed on the cantilever to collect oscillation data. This mode is useful for studying the dynamics of sample interactions. AFM is not limited to imaging; it can also be used for nanolithography, where a probe can modify the properties of materials at the nanoscale. Additionally, AFM can be used in near-field microscopy to overcome the diffraction limit, providing high-resolution optical imaging. Overall, AFM is a powerful tool with a wide range of applications in materials science, nanotechnology, and microelectronics.