The article discusses the achievement of atomic resolution in imaging the silicon (111)-(7×7) surface using atomic force microscopy (AFM) under ultrahigh-vacuum (UHV) conditions. The authors describe a force detection scheme that uses a modified cantilever beam to sense the force gradient through frequency modulation, allowing for noncontact imaging with atomic resolution (6 angstroms lateral, 0.1 angstrom vertical). The challenge of achieving atomic resolution in AFM, especially under UHV, is addressed, highlighting the difficulties in maintaining small interaction forces and reducing van der Waals forces. The use of sharp tips and operating at low temperatures is proposed as solutions. The experimental setup and imaging parameters are detailed, and the advantages of the frequency modulation (fm) noncontact method over contact AFM are discussed. The article also compares the AFM images with those obtained by scanning tunneling microscopy (STM), showing good agreement. The imaging process and the variation of the signal with distance between the probe and the sample are analyzed, providing insights into the resolution capabilities of the technique.The article discusses the achievement of atomic resolution in imaging the silicon (111)-(7×7) surface using atomic force microscopy (AFM) under ultrahigh-vacuum (UHV) conditions. The authors describe a force detection scheme that uses a modified cantilever beam to sense the force gradient through frequency modulation, allowing for noncontact imaging with atomic resolution (6 angstroms lateral, 0.1 angstrom vertical). The challenge of achieving atomic resolution in AFM, especially under UHV, is addressed, highlighting the difficulties in maintaining small interaction forces and reducing van der Waals forces. The use of sharp tips and operating at low temperatures is proposed as solutions. The experimental setup and imaging parameters are detailed, and the advantages of the frequency modulation (fm) noncontact method over contact AFM are discussed. The article also compares the AFM images with those obtained by scanning tunneling microscopy (STM), showing good agreement. The imaging process and the variation of the signal with distance between the probe and the sample are analyzed, providing insights into the resolution capabilities of the technique.