This review article by Mourdikoudis, Pallares, and Thanh provides a comprehensive overview of various characterization techniques used to study nanoparticles (NPs). The authors highlight the importance of understanding the properties of NPs, such as size, shape, crystal structure, and elemental composition, which are crucial for their applications in various fields. They discuss the strengths and limitations of different techniques, including microscopy-based methods (e.g., TEM, HRTEM, AFM), magnetic techniques (e.g., SQUID, VSM, FMR, XMCD), and spectroscopic techniques (e.g., X-ray diffraction, X-ray absorption spectroscopy, X-ray photoelectron spectroscopy). The article emphasizes the need for a combinatorial approach to characterize NPs due to the multidisciplinary nature of nanoscience and the challenges in reproducible and reliable analysis. It covers the use of X-ray-based techniques, such as XRD and XAS, which provide information on crystalline structure, elemental composition, and local atomic environments. The authors also discuss the advantages and limitations of techniques like SAXS, which can measure particle size, size distribution, and shape, and SANS, which is sensitive to light elements and isotopic labeling. Additionally, the review explores the application of XPS for surface chemical analysis, including the study of core/shell structures and ligand interactions. The authors provide examples of how these techniques have been used to understand the formation, growth, and properties of NPs, emphasizing the importance of combining multiple techniques for a comprehensive characterization of NP materials.This review article by Mourdikoudis, Pallares, and Thanh provides a comprehensive overview of various characterization techniques used to study nanoparticles (NPs). The authors highlight the importance of understanding the properties of NPs, such as size, shape, crystal structure, and elemental composition, which are crucial for their applications in various fields. They discuss the strengths and limitations of different techniques, including microscopy-based methods (e.g., TEM, HRTEM, AFM), magnetic techniques (e.g., SQUID, VSM, FMR, XMCD), and spectroscopic techniques (e.g., X-ray diffraction, X-ray absorption spectroscopy, X-ray photoelectron spectroscopy). The article emphasizes the need for a combinatorial approach to characterize NPs due to the multidisciplinary nature of nanoscience and the challenges in reproducible and reliable analysis. It covers the use of X-ray-based techniques, such as XRD and XAS, which provide information on crystalline structure, elemental composition, and local atomic environments. The authors also discuss the advantages and limitations of techniques like SAXS, which can measure particle size, size distribution, and shape, and SANS, which is sensitive to light elements and isotopic labeling. Additionally, the review explores the application of XPS for surface chemical analysis, including the study of core/shell structures and ligand interactions. The authors provide examples of how these techniques have been used to understand the formation, growth, and properties of NPs, emphasizing the importance of combining multiple techniques for a comprehensive characterization of NP materials.