This paper explores the use of detector error models to design fault-tolerant quantum circuits, which are essential for practical quantum computing applications. The authors introduce the detector error model formalism, which captures fault-tolerance at the circuit level, and provide examples to illustrate its application. They apply this formalism to three levels of abstraction in the engineering cycle of fault-tolerant circuit design: finding robust syndrome extraction circuits, identifying efficient measurement schedules, and constructing fault-tolerant procedures. Specifically, they enhance the surface code's resistance to measurement errors, devise short measurement schedules for color codes, and implement a more efficient fault-tolerant method for measuring logical operators. The paper also discusses the construction of detector matrices and measurement syndrome matrices, and how these can be used to identify and correct errors. Additionally, it explores the design of syndrome extraction circuits tailored to high measurement noise bias, and the design of fault-tolerant measurement schedules for color codes. The authors conclude by discussing the implications of their findings and proposing future directions for research.This paper explores the use of detector error models to design fault-tolerant quantum circuits, which are essential for practical quantum computing applications. The authors introduce the detector error model formalism, which captures fault-tolerance at the circuit level, and provide examples to illustrate its application. They apply this formalism to three levels of abstraction in the engineering cycle of fault-tolerant circuit design: finding robust syndrome extraction circuits, identifying efficient measurement schedules, and constructing fault-tolerant procedures. Specifically, they enhance the surface code's resistance to measurement errors, devise short measurement schedules for color codes, and implement a more efficient fault-tolerant method for measuring logical operators. The paper also discusses the construction of detector matrices and measurement syndrome matrices, and how these can be used to identify and correct errors. Additionally, it explores the design of syndrome extraction circuits tailored to high measurement noise bias, and the design of fault-tolerant measurement schedules for color codes. The authors conclude by discussing the implications of their findings and proposing future directions for research.