22 May 2024 | Bhishma Karki, Partha Sarkar, K. H. Mahmoud, A. SA. Alsubaie, Manoj Sharma
The paper presents a numerical investigation to develop a surface plasmon resonance (SPR) sensor for detecting organic materials such as pentane, n-hexane, n-heptane, and n-octane. The sensor's performance is enhanced by applying tungsten ditelluride (WTe2) onto a metal layer, particularly an Ag layer, which is found to be the most suitable for the Kretschmann configuration. The study aims to achieve high sensitivity, with theoretical values of 185.58, 202.42, 208, and 213.75 deg. RIU−1 for the organic materials. MATLAB simulations are used to optimize the layer thicknesses, and the proposed sensor is evaluated against previous research, showing superior performance in terms of sensitivity and detection accuracy. The sensor's operation is based on detecting changes in the refractive index (RI) of the analyte, which shifts the reflectance curve's resonance angle. The study also discusses the refractive indices of the layers and the mathematical modeling used to measure reflection intensity and coefficients.The paper presents a numerical investigation to develop a surface plasmon resonance (SPR) sensor for detecting organic materials such as pentane, n-hexane, n-heptane, and n-octane. The sensor's performance is enhanced by applying tungsten ditelluride (WTe2) onto a metal layer, particularly an Ag layer, which is found to be the most suitable for the Kretschmann configuration. The study aims to achieve high sensitivity, with theoretical values of 185.58, 202.42, 208, and 213.75 deg. RIU−1 for the organic materials. MATLAB simulations are used to optimize the layer thicknesses, and the proposed sensor is evaluated against previous research, showing superior performance in terms of sensitivity and detection accuracy. The sensor's operation is based on detecting changes in the refractive index (RI) of the analyte, which shifts the reflectance curve's resonance angle. The study also discusses the refractive indices of the layers and the mathematical modeling used to measure reflection intensity and coefficients.