The paper presents a new frequency modulation (FM) technique that significantly enhances the sensitivity of attractive mode force microscopy. By operating in a moderate vacuum (<10−5 Torr), the quality factor (Q) of the vibrating cantilever is increased, leading to a more than 10-fold improvement in sensitivity compared to conventional slope detection in air. The FM technique uses the cantilever as the frequency-determining element of an oscillator, with force gradients causing instantaneous frequency modulation that is demodulated by an FM detector. This method offers increased sensitivity without restricting system bandwidth, making it suitable for a wider range of applications. Experimental results demonstrate the improved sensitivity and faster response times in magnetic force microscopy images of a thin-film CoPtCr magnetic disk. The FM detection system is also noted for its simplicity in calibration and resistance to drifts, making it a promising alternative to conventional slope detection.The paper presents a new frequency modulation (FM) technique that significantly enhances the sensitivity of attractive mode force microscopy. By operating in a moderate vacuum (<10−5 Torr), the quality factor (Q) of the vibrating cantilever is increased, leading to a more than 10-fold improvement in sensitivity compared to conventional slope detection in air. The FM technique uses the cantilever as the frequency-determining element of an oscillator, with force gradients causing instantaneous frequency modulation that is demodulated by an FM detector. This method offers increased sensitivity without restricting system bandwidth, making it suitable for a wider range of applications. Experimental results demonstrate the improved sensitivity and faster response times in magnetic force microscopy images of a thin-film CoPtCr magnetic disk. The FM detection system is also noted for its simplicity in calibration and resistance to drifts, making it a promising alternative to conventional slope detection.