Fringe Projection Techniques: Whither we are?

Fringe Projection Techniques: Whither we are?

September 1, 2009 | Sai Siva Gorthi and Pramod Rastogi
Fringe projection techniques have become a prominent method in optical metrology, with applications ranging from measuring the 3D shape of MEMS components to large panels (2.5 m × 45 m). These techniques are used in various fields, including biomedical applications such as 3D intra-oral dental measurements, industrial applications like MEMS characterization, and cultural heritage preservation. The key feature of these techniques is their ability to provide high-resolution, whole-field 3D reconstruction of objects at video frame rates, making them suitable for new applications such as security systems, gaming, and virtual reality. The process of fringe projection profilometry involves projecting a structured pattern (usually a sinusoidal fringe pattern) onto the object, capturing the phase-modulated image, analyzing the image to calculate the phase modulation, unwrapping the phase to obtain the continuous phase distribution, and calibrating the system to map the phase distribution to real-world 3D coordinates. Over the last three decades, significant advancements have been made in pattern design, fringe analysis methods, phase unwrapping algorithms, and calibration techniques. These advancements have improved the accuracy, resolution, and speed of 3D shape measurement. Despite these advancements, challenges remain, particularly in micro-scale and large-scale measurements due to issues with calibration and carrier-phase component removal. Recent developments include the use of multiple projectors to solve problems like accurate 3D estimation in the presence of shadows and surface isolations, and the development of flexible calibration techniques that can automatically determine geometric parameters even when the setup is arbitrarily arranged. This special issue provides a comprehensive overview of the state-of-the-art in fringe projection techniques, covering different facets of the field and serving as a valuable reference for both researchers and professionals.Fringe projection techniques have become a prominent method in optical metrology, with applications ranging from measuring the 3D shape of MEMS components to large panels (2.5 m × 45 m). These techniques are used in various fields, including biomedical applications such as 3D intra-oral dental measurements, industrial applications like MEMS characterization, and cultural heritage preservation. The key feature of these techniques is their ability to provide high-resolution, whole-field 3D reconstruction of objects at video frame rates, making them suitable for new applications such as security systems, gaming, and virtual reality. The process of fringe projection profilometry involves projecting a structured pattern (usually a sinusoidal fringe pattern) onto the object, capturing the phase-modulated image, analyzing the image to calculate the phase modulation, unwrapping the phase to obtain the continuous phase distribution, and calibrating the system to map the phase distribution to real-world 3D coordinates. Over the last three decades, significant advancements have been made in pattern design, fringe analysis methods, phase unwrapping algorithms, and calibration techniques. These advancements have improved the accuracy, resolution, and speed of 3D shape measurement. Despite these advancements, challenges remain, particularly in micro-scale and large-scale measurements due to issues with calibration and carrier-phase component removal. Recent developments include the use of multiple projectors to solve problems like accurate 3D estimation in the presence of shadows and surface isolations, and the development of flexible calibration techniques that can automatically determine geometric parameters even when the setup is arbitrarily arranged. This special issue provides a comprehensive overview of the state-of-the-art in fringe projection techniques, covering different facets of the field and serving as a valuable reference for both researchers and professionals.
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