This study investigates the structural and dielectric properties of barium zirconate titanate (BaZr_xTi_{1-x}O_3) with varying zirconium (Zr) content (x = 0, 0.15, 0.5, 0.75, and 1) synthesized using the tartrate precursor method. The X-ray diffraction (XRD) results confirm the formation of a perovskite structure, with the tetragonal phase dominating for x = 0, 0.15, 0.5, and 0.75, while x = 1 exhibits a cubic phase. The grain size increases with Zr content up to x = 0.75, after which it decreases. Transmission electron microscopy (TEM) images show that nanocrystallites agglomerate, with average particle sizes ranging from 20.75 nm to 63.75 nm. The piezoelectric coefficient (d_33) decreases with increasing Zr content, and there is an inverse relationship between grain size and d_33. The remnant polarization increases with Zr content, suggesting potential applications in permanent memory devices. Fourier transform infrared (FTIR) analysis confirms the presence of perovskite phases, with the BaCO_3 phase decreasing as Zr content increases. Scanning electron microscopy (SEM) and TEM analyses reveal that Zr doping enhances grain size and crystallinity, while the tetragonality factor (c/a) increases with Zr content. The ferroelectric hysteresis loops show that the remnant polarization increases up to x = 0.75, indicating that Zr is a suitable dopant for domain alignment in BZT samples. The study highlights the complex interplay between Zr doping, crystal structure, grain size, and piezoelectric properties in BZT, providing insights into the development of novel ferroelectric materials with tailored properties for specific applications.This study investigates the structural and dielectric properties of barium zirconate titanate (BaZr_xTi_{1-x}O_3) with varying zirconium (Zr) content (x = 0, 0.15, 0.5, 0.75, and 1) synthesized using the tartrate precursor method. The X-ray diffraction (XRD) results confirm the formation of a perovskite structure, with the tetragonal phase dominating for x = 0, 0.15, 0.5, and 0.75, while x = 1 exhibits a cubic phase. The grain size increases with Zr content up to x = 0.75, after which it decreases. Transmission electron microscopy (TEM) images show that nanocrystallites agglomerate, with average particle sizes ranging from 20.75 nm to 63.75 nm. The piezoelectric coefficient (d_33) decreases with increasing Zr content, and there is an inverse relationship between grain size and d_33. The remnant polarization increases with Zr content, suggesting potential applications in permanent memory devices. Fourier transform infrared (FTIR) analysis confirms the presence of perovskite phases, with the BaCO_3 phase decreasing as Zr content increases. Scanning electron microscopy (SEM) and TEM analyses reveal that Zr doping enhances grain size and crystallinity, while the tetragonality factor (c/a) increases with Zr content. The ferroelectric hysteresis loops show that the remnant polarization increases up to x = 0.75, indicating that Zr is a suitable dopant for domain alignment in BZT samples. The study highlights the complex interplay between Zr doping, crystal structure, grain size, and piezoelectric properties in BZT, providing insights into the development of novel ferroelectric materials with tailored properties for specific applications.