This study investigates the influence of zirconium concentration on the structure and dielectric properties of barium zirconate titanate (BaZr$_x$Ti$_{1-x}$O$_3$) using the tartrate precursor technique. The research examines the impact of varying zirconium content (x = 0, 0.15, 0.50, 0.75, and 1) on the material's morphology, crystal structure, piezoelectric coefficient ($d_{33}$), and ferroelectric hysteresis loop. Key findings include: 1. **Crystal Structure and Morphology**: X-ray diffraction (XRD) and transmission electron microscopy (TEM) analyses confirm the formation of a perovskite structure with a tetragonal phase for samples up to x = 0.75, while the cubic phase is observed for x = 1. The grain size increases with Zr concentration, and nanocrystallites agglomerate, resulting in irregular morphologies. 2. **Dielectric Properties**: The piezoelectric coefficient ($d_{33}$) decreases with increasing Zr content, indicating a negative correlation between grain size and $d_{33}$. The remnant polarization increases with Zr content, suggesting potential applications in permanent memory devices. 3. **Ferroelectric Hysteresis Loop**: The hysteresis loop inclination increases with Zr content up to x = 0.75, indicating enhanced domain alignment. The samples exhibit relaxor ferroelectric behavior, characterized by soft hysteresis loops. The study highlights the complex interplay between Zr doping, crystal structure, grain size, and dielectric properties, providing insights into the development of tailored ferroelectric materials for specific applications.This study investigates the influence of zirconium concentration on the structure and dielectric properties of barium zirconate titanate (BaZr$_x$Ti$_{1-x}$O$_3$) using the tartrate precursor technique. The research examines the impact of varying zirconium content (x = 0, 0.15, 0.50, 0.75, and 1) on the material's morphology, crystal structure, piezoelectric coefficient ($d_{33}$), and ferroelectric hysteresis loop. Key findings include: 1. **Crystal Structure and Morphology**: X-ray diffraction (XRD) and transmission electron microscopy (TEM) analyses confirm the formation of a perovskite structure with a tetragonal phase for samples up to x = 0.75, while the cubic phase is observed for x = 1. The grain size increases with Zr concentration, and nanocrystallites agglomerate, resulting in irregular morphologies. 2. **Dielectric Properties**: The piezoelectric coefficient ($d_{33}$) decreases with increasing Zr content, indicating a negative correlation between grain size and $d_{33}$. The remnant polarization increases with Zr content, suggesting potential applications in permanent memory devices. 3. **Ferroelectric Hysteresis Loop**: The hysteresis loop inclination increases with Zr content up to x = 0.75, indicating enhanced domain alignment. The samples exhibit relaxor ferroelectric behavior, characterized by soft hysteresis loops. The study highlights the complex interplay between Zr doping, crystal structure, grain size, and dielectric properties, providing insights into the development of tailored ferroelectric materials for specific applications.