This book provides a concise overview of design patterns, relating them to concrete design. Chapters 17 and 18 serve as a "front-end" to the Patterns book by Gamma et al., offering condensed descriptions of the same design patterns with a classification and relationships between them. The book is strongly recommended for its clear and organized presentation of design patterns. "Metrics and Models in Software Quality Engineering" by Stephen H. Kan is a comprehensive guide to measuring and improving software development processes. It covers topics such as software quality, development process models, software quality metrics, defect removal, the Raleigh Reliability Model, reliability growth models, management models, complexity metrics, and customer satisfaction analysis. The book begins with the definition of software quality, measurement theory, quality control, and defect removal, and concludes with a discussion of customer satisfaction data. It is praised for its varied information on metrics and its detailed discussion of customer satisfaction. The review also includes a calendar of future events, including SIGSOFT-sponsored and cooperative events such as ISSTA 1996, AI in Economics and Management, Formal Methods in SW Practice, USENIX 1996 Technical Conf., EUROMICRO Wrksp on Parallel and Dist. Processing, and others. Each event includes details about the location, dates, and contact information.This book provides a concise overview of design patterns, relating them to concrete design. Chapters 17 and 18 serve as a "front-end" to the Patterns book by Gamma et al., offering condensed descriptions of the same design patterns with a classification and relationships between them. The book is strongly recommended for its clear and organized presentation of design patterns. "Metrics and Models in Software Quality Engineering" by Stephen H. Kan is a comprehensive guide to measuring and improving software development processes. It covers topics such as software quality, development process models, software quality metrics, defect removal, the Raleigh Reliability Model, reliability growth models, management models, complexity metrics, and customer satisfaction analysis. The book begins with the definition of software quality, measurement theory, quality control, and defect removal, and concludes with a discussion of customer satisfaction data. It is praised for its varied information on metrics and its detailed discussion of customer satisfaction. The review also includes a calendar of future events, including SIGSOFT-sponsored and cooperative events such as ISSTA 1996, AI in Economics and Management, Formal Methods in SW Practice, USENIX 1996 Technical Conf., EUROMICRO Wrksp on Parallel and Dist. Processing, and others. Each event includes details about the location, dates, and contact information.