The study investigates the quantification of defects in graphene using Raman spectroscopy at different excitation energies. The researchers used Ar$^+$-bombarded graphene samples with increasing ion doses to create controlled defect densities. They found that the ratio of the D to G peak intensities strongly depends on the laser excitation energy. The study presents empirical equations to determine the point defect density in graphene via Raman spectroscopy for any visible excitation energy. The analysis shows that the D to G intensity ratio reaches a maximum for an inter-defect distance of approximately 3 nm, indicating that a given ratio can correspond to two different defect densities. The G peak width and its dispersion with excitation energy are used to resolve this ambiguity. The results provide a comprehensive understanding of how defect density affects Raman spectroscopic signatures in graphene, which is crucial for both fundamental research and practical applications.The study investigates the quantification of defects in graphene using Raman spectroscopy at different excitation energies. The researchers used Ar$^+$-bombarded graphene samples with increasing ion doses to create controlled defect densities. They found that the ratio of the D to G peak intensities strongly depends on the laser excitation energy. The study presents empirical equations to determine the point defect density in graphene via Raman spectroscopy for any visible excitation energy. The analysis shows that the D to G intensity ratio reaches a maximum for an inter-defect distance of approximately 3 nm, indicating that a given ratio can correspond to two different defect densities. The G peak width and its dispersion with excitation energy are used to resolve this ambiguity. The results provide a comprehensive understanding of how defect density affects Raman spectroscopic signatures in graphene, which is crucial for both fundamental research and practical applications.