This study presents a real-time imaging technique for observing and analyzing standing wave patterns in microresonators using a short-wave infrared (SWIR) camera. The technique involves bidirectional pumping of a microresonator to generate standing waves, which are then imaged by the SWIR camera. The scattered light intensity is found to be linearly related to the circulating power within the microresonator. By modulating the relative phase between the two pump waves, the standing wave patterns can be controlled and visualized in real time. This allows for subwavelength distance measurements of scattering targets with nanometer-level accuracy. The method enables precise characterization of microresonator dynamics, which has applications in near-field sensing, photonic integrated circuits, and telecom systems. The study demonstrates the use of a SWIR camera to visualize standing wave patterns in a toroidal microresonator. The experimental setup involves a continuously tunable laser, an erbium-doped fiber amplifier, and a 50/50 coupler to generate counterpropagating light waves. The relative phase between the two pump waves is controlled to manipulate the standing wave patterns. The SWIR camera captures the scattered light, which is used to characterize the standing wave patterns. The results show that the scattered intensity is dependent on the pump wavelength and the position of the scatterer relative to the standing wave. The study also shows that the scattered light intensity is linearly related to the power coupled into the cavity. This relationship is confirmed through experiments where the transmitted power and scattered intensity are measured as functions of laser detuning. The results indicate that the scattered light intensity increases linearly with the intracavity power. The standing wave patterns are simulated using finite element method (FEM) to validate the experimental findings. The study further demonstrates the use of the standing wave patterns for precise distance measurements between scatterers. By analyzing the phase difference between the scattered light intensities, the distance between scatterers can be calculated with high accuracy. The results show that the measured distances have uncertainties as small as 5 nm, which is less than 1/300th of the pump wavelength. The method is also shown to be repeatable over time, with minimal changes in the measured distances. The study highlights the potential of the real-time imaging technique for applications in biosensing, resonator characterization, and real-time monitoring of soliton states. The method provides a simple and effective way to study the dynamics of light-matter interactions in microresonators, which could lead to advancements in integrated nanophotonic applications. The results demonstrate the feasibility of using the technique for high-precision distance measurements and the potential for further applications in sensing and other advanced integrated nanophotonic systems.This study presents a real-time imaging technique for observing and analyzing standing wave patterns in microresonators using a short-wave infrared (SWIR) camera. The technique involves bidirectional pumping of a microresonator to generate standing waves, which are then imaged by the SWIR camera. The scattered light intensity is found to be linearly related to the circulating power within the microresonator. By modulating the relative phase between the two pump waves, the standing wave patterns can be controlled and visualized in real time. This allows for subwavelength distance measurements of scattering targets with nanometer-level accuracy. The method enables precise characterization of microresonator dynamics, which has applications in near-field sensing, photonic integrated circuits, and telecom systems. The study demonstrates the use of a SWIR camera to visualize standing wave patterns in a toroidal microresonator. The experimental setup involves a continuously tunable laser, an erbium-doped fiber amplifier, and a 50/50 coupler to generate counterpropagating light waves. The relative phase between the two pump waves is controlled to manipulate the standing wave patterns. The SWIR camera captures the scattered light, which is used to characterize the standing wave patterns. The results show that the scattered intensity is dependent on the pump wavelength and the position of the scatterer relative to the standing wave. The study also shows that the scattered light intensity is linearly related to the power coupled into the cavity. This relationship is confirmed through experiments where the transmitted power and scattered intensity are measured as functions of laser detuning. The results indicate that the scattered light intensity increases linearly with the intracavity power. The standing wave patterns are simulated using finite element method (FEM) to validate the experimental findings. The study further demonstrates the use of the standing wave patterns for precise distance measurements between scatterers. By analyzing the phase difference between the scattered light intensities, the distance between scatterers can be calculated with high accuracy. The results show that the measured distances have uncertainties as small as 5 nm, which is less than 1/300th of the pump wavelength. The method is also shown to be repeatable over time, with minimal changes in the measured distances. The study highlights the potential of the real-time imaging technique for applications in biosensing, resonator characterization, and real-time monitoring of soliton states. The method provides a simple and effective way to study the dynamics of light-matter interactions in microresonators, which could lead to advancements in integrated nanophotonic applications. The results demonstrate the feasibility of using the technique for high-precision distance measurements and the potential for further applications in sensing and other advanced integrated nanophotonic systems.